The availability of all equipment and the Applied Research Center Conference Rooms can be viewed on the CALENDAR.

 The availability of individual pieces of equipment and each conference room can be viewed through the links below:

            Thrift II Time of Flight Secondary Ion Mass Spectrometer (ToF-SIMS)

Hitachi 4700 Scanning Electron Microscope with Energy-Dispersive X-Ray Spectroscopy (Hitachi 4700 SEM/EDX)

Hitachi S-570 Scanning Electron Microscope with Energy-Dispersive X-Ray Spectroscopy (Hitachi 570 SEM/EDX) -located on main campus

Nicolet Nexus 670 Fourier Transform-Infrared Spectrometer (FT-IR)

HIROX KH-3000VD High Resolution Digital-Video Microscopy System (HIROX)

M44 Variable Angle Spectroscopic Ellipsometer (VASE)

Dektak 3 ST Surface Profiler (Suface Profiler)

Digital Instruments Scanning Probe Microscope (SPM)

Shimadzu Vickers Microhardness Tester Type M (Hardness Tester)

Main Conference Room (Room 100)

Video Conference Room (Room 301)

Large Conference Room (Room 201)

Small Conference Room (Room 200)